Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-06-20
2006-06-20
Ngô, Ngân V. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000, C365S145000, C365S149000
Reexamination Certificate
active
07064366
ABSTRACT:
Ferroelectric memory devices are formed on an integrated circuit substrate. A bottom interlayer dielectric layer is positioned on the integrated circuit substrate and a plurality of ferroelectric capacitors are arranged in a row and column relationship on the bottom interlayer dielectric layer. A top interlayer dielectric layer is disposed on a surface of the integrated circuit substrate including the plurality of ferroelectric capacitors. The top interlayer dielectric layer includes via holes disposed on and associated with ones of the ferroelectric capacitors. A plate electrode is formed in the top interlayer dielectric layer. The plate electrode extends into respective ones of the via holes to contact top surfaces of at least two neighboring ones of the plurality of ferroelectric capacitors. Methods or fabricating ferroelectric memory devices are also provided.
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Notice to Submit Response for corresponding Korean Application No. 10-2003-0012765 dated Aug. 26, 2004 (English Translation).
Jang Nak-Won
Kang Hyun-Yul
Song Yoon-Jong
Myers Bigel & Sibley & Sajovec
Ngo Ngan V.
Samsung Electronics Co,. Ltd.
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