Static information storage and retrieval – Systems using particular element – Ferroelectric
Reexamination Certificate
2005-08-02
2005-08-02
Tran, Michael (Department: 2827)
Static information storage and retrieval
Systems using particular element
Ferroelectric
C365S189090
Reexamination Certificate
active
06924998
ABSTRACT:
A nonvolatile ferroelectric memory device includes a cell array having a multi-bitline structure for converting a sensing voltage of a sub bitline into current to induce a sensing voltage of a main bitline. The memory device comprises a plurality of cell array blocks, a common data bus, a sense amplifier array unit and a reference voltage controller. The common data bus, shared by the plurality of cell array blocks, transmits cell data of the cell array blocks. The sense amplifier array unit compares a reference voltage with cell data applied from the common data bus and senses the cell data. The reference voltage controller generates an adjustable internal reference voltage by adjusting a ferroelectric capacitance, selectively switches the internal reference voltage and an external reference voltage applied from a pad, and outputs the selectively switched value as the reference voltage into the sense amplifier array unit. In the memory device, cell characteristics can be tested without extra mask layer processes by programmably selecting reference voltages. Additionally, weak cells are effectively repaired by regulating reference voltages programmably, thereby improving yield and reliability of a chip.
REFERENCES:
patent: 5396113 (1995-03-01), Park et al.
patent: 6081453 (2000-06-01), Iwahashi
patent: 6215692 (2001-04-01), Kang
patent: 1019980014400 (2000-07-01), None
Hynix / Semiconductor Inc.
Tran Michael
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