Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-10-04
2010-11-30
Tabone, Jr., John J (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S025000, C714S031000, C714S737000, C714S742000, C714SE11024, C714SE11025, C714SE11026, C714SE11029, C702S058000, C702S059000, C702S117000, C702S185000, C324S500000, C324S512000, C324S528000, C324S765010
Reexamination Certificate
active
07844873
ABSTRACT:
A fault location estimation system includes single-fault-assumed diagnostic unit nodes; error-observation node basis candidate classification unit; inclusion fault candidate group selection unit; inter-pattern overlapping unit; and multiple-fault simulation checking unit.
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NEC Electronics Corporation
Tabone, Jr. John J
Young & Thompson
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