Fault injection in dynamic random access memory modules for...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S040000, C714S042000, C714S703000

Reexamination Certificate

active

07827445

ABSTRACT:
Fault injection in dynamic random access memory (‘DRAM’) modules for performing built-in self-tests (‘BISTs’) including establishing, in the mode registers of the DRAM modules by the memory controller through the shared address bus, an injection of a fault into one or more signal lines of a DRAM module, the fault characterized by a fault type; writing data by the memory controller through a data bus to the DRAM modules, the data identifying a particular DRAM module; and responsive to receiving the data, injecting, by the particular DRAM module, the fault characterized by the fault type into the one or more signal lines of the particular DRAM module.

REFERENCES:
patent: 5671352 (1997-09-01), Subrahmaniam et al.
patent: 5961653 (1999-10-01), Kalter et al.
patent: 5999468 (1999-12-01), Lawrence
patent: 6343366 (2002-01-01), Okitaka
patent: 6543016 (2003-04-01), Lewandowski et al.
patent: 6567950 (2003-05-01), Bertin et al.
patent: 6636825 (2003-10-01), Malladi et al.
patent: 6799287 (2004-09-01), Sharma et al.
patent: 6842867 (2005-01-01), Cooper
patent: 6886116 (2005-04-01), MacLellan et al.
patent: 6934900 (2005-08-01), Cheng et al.
patent: 7076706 (2006-07-01), Eckelman et al.
patent: 7089461 (2006-08-01), Gilbert et al.
patent: 7149945 (2006-12-01), Brueggen
patent: 7234081 (2007-06-01), Nguyen et al.
patent: 7334159 (2008-02-01), Callaghan
patent: 7370251 (2008-05-01), Nadeau-Dostie et al.
patent: 7401269 (2008-07-01), Hoda et al.
patent: 2002/0064033 (2002-05-01), Deane et al.
Fifield, et al.; Self-Test Feature for On-Chip Error Correction Code System; TDB May 1989; 1989; pp. 64-65; Burlington.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fault injection in dynamic random access memory modules for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fault injection in dynamic random access memory modules for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fault injection in dynamic random access memory modules for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4233825

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.