Fabrication of wire bond pads over underlying active...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Ball or nail head type contact – lead – or bond

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S786000, C257S784000, C257SE23020

Reexamination Certificate

active

10434524

ABSTRACT:
A wire connection structure for an integrated circuit (IC) die includes a semiconductor wafer with an active device and/or a passive device. One or more dielectric layers are arranged adjacent to the active and/or passive device. One or more metal interconnect layers are arranged adjacent to the active and/or passive device. A contact pad is arranged in an outermost metal interconnect layer. A passivation layer is arranged over the outermost metal interconnect layer and includes at least one passivation opening that exposes the contact pad. A bond pad is arranged over the passivation layer and the active and/or passive device and is connected to the contact pad through the passivation opening. Formation of the bond pad does not damage the active and/or passive device.

REFERENCES:
patent: 4927505 (1990-05-01), Sharma et al.
patent: 5108950 (1992-04-01), Wakabayashi et al.
patent: 5384488 (1995-01-01), Golshan et al.
patent: 5659201 (1997-08-01), Wollesen
patent: 5665639 (1997-09-01), Seppala et al.
patent: 5719448 (1998-02-01), Ichikawa
patent: 5969424 (1999-10-01), Matsuki et al.
patent: 6037668 (2000-03-01), Cave et al.
patent: 6066877 (2000-05-01), Williams et al.
patent: 6143396 (2000-11-01), Saran et al.
patent: 6184121 (2001-02-01), Buchwalter et al.
patent: 6187680 (2001-02-01), Costrini et al.
patent: 6204074 (2001-03-01), Bertolet et al.
patent: 6229221 (2001-05-01), Kloen et al.
patent: 6232662 (2001-05-01), Saran
patent: 6303423 (2001-10-01), Lin
patent: 6376353 (2002-04-01), Zhou et al.
patent: 6378759 (2002-04-01), Ho et al.
patent: 6383916 (2002-05-01), Lin
patent: 6465879 (2002-10-01), Taguchi
patent: 6544880 (2003-04-01), Akram
patent: 6593649 (2003-07-01), Lin et al.
patent: 6649509 (2003-11-01), Lin et al.
patent: 6706622 (2004-03-01), McCormick
patent: 6710460 (2004-03-01), Morozumi
patent: 6730982 (2004-05-01), Barth et al.
patent: 6756295 (2004-06-01), Lin et al.
patent: 6762115 (2004-07-01), Lin et al.
patent: 6800555 (2004-10-01), Test et al.
patent: 2002/0068385 (2002-06-01), Ma et al.
patent: 2003/0087130 (2003-05-01), Sugawara
patent: 2004/0070042 (2004-04-01), Lee et al.
patent: 2004/0166659 (2004-08-01), Lin et al.
patent: 58028858 (1983-02-01), None
patent: WO 00/35013 (2000-06-01), None
Lammers, David “LSI Logic Extends Reach of Wire Bond Packaging,”EE TimesOct. 23, 2001 at <http://www.eet.com/story/OEG20021022S0023> visited on Oct. 23, 2002, 4 pages total.
MEG02-008 “Method of Wire Bonding Over Active Area of a Semiconductor Circuit”—U.S. Appl. No. 09/858,528, filed on May 7, 2001.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fabrication of wire bond pads over underlying active... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fabrication of wire bond pads over underlying active..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabrication of wire bond pads over underlying active... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3895450

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.