Fabrication of silicides by excimer laser annealing of amorphous

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438166, 438308, 438581, 438649, 438662, H01L 2144

Patent

active

060603925

ABSTRACT:
Stable suicides are formed utilizing excimer laser crystallization in place of a conventional second high temperature rapid thermal processing annealing step. Specifically, thermally unstable silicide having a metal-rich surface layer is conventionally formed utilizing deposition of refractory metal followed by low temperature annealing. After removal of unreacted refractory metal, an amorphous silicon film is deposited on top of the unstable silicide and exposed to radiation from an excimer laser, such that the amorphous silicon melts, reacts with refractory metal from the underlying unstable silicide, and reforms as thermally stable silicide evidencing low electrical resistance.

REFERENCES:
patent: 5488000 (1996-01-01), Zhang et al.
patent: 5766989 (1998-06-01), Maegawa et al.
patent: 5804499 (1998-09-01), Dehm et al.
patent: 5879977 (1999-03-01), Zhang et al.
patent: 5897347 (1999-04-01), Yamazaki et al.
patent: 5904770 (1999-05-01), Ohtani et al.
patent: 5923968 (1999-07-01), Yamazaki et al.
Sigmon, "Silicide Formation Using Laser and Electron Beams," Laser and Electron-Beam Solid Interactions and Materials Processing, pp. 511-523 (1981).
Chen, et al., "Polysilicon TFT Technology Will Solve Problems of Mobility, Pixel Size, Cost, and Yield," Solid State Technology, pp. 113-120 (1996).
Maa, et al., "Reaction of Amorphous Silicon With Cobalt and Nickel Silicides Before Disilicide Formation," Mat. Res. Symp. Proc. 402, pp. 185-190 (1996).
Osburn, et al., "Metal Silicodes: Active Elements of ULSI Contacts," J. Electron. Mater. 25 (11), pp. 1725-1739 (1996).
Zhang, et al., "KrF Excimer Laser Annealed TFT with Very High Field-Effect Mobility of 329 cm.sup.2 /V.cndot.s," IEEE Electron Device Lett. 13 (5), pp. 297-299 (1992).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fabrication of silicides by excimer laser annealing of amorphous does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fabrication of silicides by excimer laser annealing of amorphous, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabrication of silicides by excimer laser annealing of amorphous will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1064581

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.