Fabrication of semiconductor device having shallow junctions inc

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438300, 438301, 438305, 438978, 257347, 257382, 257750, H01L 21336, H01L 218238, H01L 2701, H01L 2976, H01L 2348

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active

060252421

ABSTRACT:
A semiconductor device having shallow junctions is provided by providing a semiconductor substrate having source and drain regions and polysilicon gate regions; depositing selective silicon on the source and drain regions; providing dopant into the source and drain regions forming shallow junctions; forming first insulating spacers on sidewalls of the gate regions; forming second insulating sidewall spacers on the first insulating spacers; and siliciding the top surfaces of the source and drain regions.

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