Fabrication of conductivity enhanced MOS-gated semiconductor dev

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438138, 438206, 438209, 438212, 438526, 438554, H01L 21336

Patent

active

059703431

ABSTRACT:
In the manufacture of an MOS gated semiconductor device, indentations are provided on a surface of a semiconductor wafer extending inwardly of respective spaced apart regions at the wafer surface having doping concentrations greater than that present in the remainder of the wafer. A layer of silicon having a doping concentration less than that of the substrate is conformally provided on the substrate surface whereby the indentations in the substrate surface are replicated on the surface of the silicon layer. Dopants in the substrate regions are then out-diffused into the silicon layer to provide highly doped buried regions within the layer. Then, using the silicon layer surface indentations as photomask alignment marks, gate electrode structures are formed on and within the silicon layer in preselected orientation relative to the buried regions. The buried regions provide low resistance paths for current through the resulting devices.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fabrication of conductivity enhanced MOS-gated semiconductor dev does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fabrication of conductivity enhanced MOS-gated semiconductor dev, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabrication of conductivity enhanced MOS-gated semiconductor dev will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2068413

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.