Fabrication methods for compressive strained-silicon and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S528000, C438S938000, C257SE21618

Reexamination Certificate

active

10909403

ABSTRACT:
Fabrication methods for compressive strained-silicon by ion implantation. Ions are implanted into a silicon-containing substrate and high temperature processing converts the vicinity of the ion-contained region into strained-silicon. Transistors fabricated by the method are also provided.

REFERENCES:
patent: 6228694 (2001-05-01), Doyle et al.
patent: 6803270 (2004-10-01), Dokumachi et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fabrication methods for compressive strained-silicon and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fabrication methods for compressive strained-silicon and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabrication methods for compressive strained-silicon and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3830294

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.