Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-12-25
2007-12-25
Nguyen, Thanh (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S244000, C438S386000, C438S387000, C257SE29346
Reexamination Certificate
active
11127505
ABSTRACT:
The present invention provides a fabrication method for a semiconductor structure having integrated capacitors and a corresponding semiconductor structure. The fabrication method has the following steps of: providing a semiconductor substrate (1; 1′, 60, 1″) having a front side (VS) and a rear side (RS); providing trenches (5) in the semiconductor substrate (1; 1′, 60, 1″) proceeding from the front side (VS) of the semiconductor substrate (1; 1′, 60, 1″); providing a respective inner capacitor electrode (6) in the trenches (5); uncovering the inner capacitor electrodes (6) proceeding from the rear side (RS) of the semiconductor substrate (1; 1′, 60, 1″); providing a capacitor dielectric (40) on the uncovered inner capacitor electrodes (6); and providing outer capacitor electrodes (50) on the capacitor dielectric (40) on the inner capacitor electrodes (6).
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German Office Action dated Jan. 13, 2005.
Gutsche Martin
Seidl Harald
Infineon - Technologies AG
Jenkins Wilson Taylor & Hunt, P.A.
Nguyen Thanh
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