Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-07-07
2008-12-09
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S233000, C438S564000, C257SE21619, C257SE21634, C257SE21151
Reexamination Certificate
active
07462537
ABSTRACT:
A method of fabricating a non-volatile memory is provided. A substrate having a trench therein for forming a trench device is provided. Then, a doped metal silicide layer is formed on the substrate in the trench. A heating process is performed to form a source/drain area in the substrate under the doped metal silicide layer. Thereafter, a first conductive layer is formed on the doped metal silicide layer to fill up the trench.
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Lai Liang-Chuan
Wang Pin-Yao
Fourson George
Jianq Chyun IP Office
Maldonado Julio J.
Powerchip Semiconductor Corp.
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