Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-10-16
2007-10-16
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C716S030000
Reexamination Certificate
active
10891618
ABSTRACT:
The present invention is directed to a logic testing architecture with an improved decompression engine and a method of decompressing scan chains for testing logic circuits.
REFERENCES:
patent: 6701476 (2004-03-01), Pouya et al.
patent: 2004/0107395 (2004-06-01), Volkerink et al.
“Built-in Test for Circuits with Scan Based on Reseeding of Multiple-polynomial Linear Feedback Shift Registers” by Hellebrand et al. This paper appears in IEEE Transactions on Computers, Publication Date: Feb. 1995 vol. 44, Issue: 2 On pp. 223-233.
Hellebrand, S. et al., “Generation of Vector Patterns Through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers”, International Test Conference 1992.
Venkataraman, S. et al., “An Efficient BIST Scheme Based on Reseeding of Multiple Polynomial Linear Feedback Shift Registers”, IEEE 1993.
Rajski, J. et al., “Embedded Deterministic Test for Low Cost Manufacturing Test”, ITC International Test Conference 2002.
Synopsys, “DFT Compiler SoCBIST Deterministic Logic BIST, Technology Backgrounder”, 2002 Synopsys, Inc.
Santarini, M., “SynTest Readies Scan-Test Data Compaction Tool”, EETimes, 2002.
Konemann, B., “LFSR-Coded Test Patterns for Scan Designs”, Proceedings of the European Test Conference, 1991.
Chakradhar Srimat T.
Wang Seongmoon
Britt Cynthia
NEC Laboratories America, Inc.
LandOfFree
Externally-loaded weighted random test pattern compression does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Externally-loaded weighted random test pattern compression, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Externally-loaded weighted random test pattern compression will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3902193