Static information storage and retrieval – Read/write circuit – Bad bit
Patent
1995-12-27
1997-06-17
Dinh, Son T.
Static information storage and retrieval
Read/write circuit
Bad bit
36518907, G11C 700
Patent
active
056403534
ABSTRACT:
An apparatus and method for bit defect compensation is disclosed which comprises a tag address means for storing addresses of defective bits of a DRAM; a compensation data means for storing replacing bits utilized to replace the defective bits; a control circuit that provides logic and timing controls for compensation actions; and a comparator that provides comparison function between DRAM access address and addresses stored in the tag address means, and generates a compensation address to access the replacing bits in the compensation data means when necessary. The present invention provides an improved apparatus and method for compensating for the problem of bit defect, and improving the traditional fail bit memory scheme.
REFERENCES:
patent: 4757474 (1988-07-01), Fukushi et al.
patent: 4803656 (1989-02-01), Takemae
patent: 5195057 (1993-03-01), Kasa et al.
Act Corporation
Dinh Son T.
LandOfFree
External compensation apparatus and method for fail bit dynamic does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with External compensation apparatus and method for fail bit dynamic , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and External compensation apparatus and method for fail bit dynamic will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2162875