Extending test sequences to accepting states

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S742000, C714S038110, C717S100000, C717S128000, C717S124000, C703S013000, C703S023000, C703S014000, C703S015000

Reexamination Certificate

active

07493544

ABSTRACT:
State spaces are traversed to produce test cases, or test coverage. Test coverage is a test suite of sequences. Accepting states are defined. Expected costs are assigned to the test graph states. Strategies are created providing transitions to states with lower expected costs. Linear programs and other approximations are discussed for providing expected costs. Strategies are more likely to provide access to an accepting state, based on expected costs. Strategies are used to append transitions to test segments such that the new test segment ends in an accepting state.

REFERENCES:
patent: 5796752 (1998-08-01), Sun et al.
patent: 7088864 (2006-08-01), Grieskamp et al.
patent: 7149678 (2006-12-01), Gurevich et al.
patent: 7315973 (2008-01-01), Wise
patent: 2005/0050391 (2005-03-01), Grieskamp et al.
patent: 2005/0160404 (2005-07-01), Nachmanson et al.
patent: 2005/0198621 (2005-09-01), Tillman et al.
patent: 2006/0161404 (2006-07-01), Campbell et al.
Alur, et al., “Alternating Refinement Relations,” inProceedings of the Ninth International Conference on Concurrency Theory(CONCUE'98), vol. 1466 of LNCS, 16 pages, 1998.
Alur, et al., “Distinguishing tests for nondeterministic and probabilistic machines,” inProceedings of the 27thACM Symposium on Theory of Computing, 10 pages, 1995.
Artho, et al., “Experiments with Test Case Generation and Runtime Analysis,”Abstract State Machines 2003, vol. 2589 of LNCS, 18 pages, 2003.
Barnett, et al., “The Spec# Programming System: An Overview,” in M. Huisman, editor,Cassis International Workshop, LNCS, Springer, 21 pages, 2004.
Barnett, et al., “Towards a Tool Environment for Model-Based Testing with AsmL,” inFormal Approaches to Software Testing, FATES 2004, vol. 2931 of LNCS, pp. 252-266, Springer-Verlag, 2004.
Box, “Code Name Indigo: A Guide to Developing and Running Connected Systems with Indigo,”MSDN Magazine, 12 pages, Jan. 2004.
Brinksma, et al., “Testing Transition Systems: An Annotated Bibliography,”Summer School MOVEP 2000: Modeling and Verification of Parallel Processes, vol. 2067 of LNCS, 10 pages, Springer, 2001.
Campbell, et al., “Spec Explorer: An Integrated Environment for Model-Based Testing,”UW-MSR Summer Institute '04, 13 pages, Aug. 2004.
Campbell, et al., “State Exploration with Multiple State Groupings,” in D. Beauquier, E. Börger, and A. Slissenko, editors,12th International Workshop on Abstract State Machines, ASM '05, pp. 119-130, Mar. 2005.
Campbell, et al., “Testing Concurrent Object-Oriented Systems with Spec Explorer,” inProceedings of the Formal Methods 2005, vol. 3582 of LNCS, pp. 542-547, Spring-Verlag, 2005.
Chatterjee, et al., “Simple Stochastic Parity Games,” inCSL'03, vol. 2803 of LNCS, Springer, 15 pages, 2003.
De Alfaro, “Computing Minimum and Maximum Reachability Times in Probabilistic Systems,” inProceedings CONCUR 99, J.C.M. Baeten and S. Mauw eds., vol. 1664 of Lecture Notes in Computer Science, Springer-Verlag, 17 pages, 1999.
De Alfaro, “Game Models for Open Systems,” inProceedings of the International Symposium on Verification(Theory in Practice), vol. 2772 of Lect. Notes in Comp. Sci. Springer-Verlag, 26 pages, 2003.
Fujiwara, et al., “Testing nondeterministic state machines with fault-coverage,”Protocol Test Systems IV, pp. 267-280, North Holland, 1992.
Glässer, et al., “Abstract Communication Model for Distributed Systems,”IEEE Transactions on Software Engineering, vol. 30, No. 7, pp. 458-472, Jul. 2004.
Grieskamp, et al., “Generating Finite State Machines from Abstract State Machines,” inProceedings of the International Symposium on Software Testing and Analysis(ISSTA), vol. 27, 19 pages, Jul. 2002.
Grieskamp, et al., “Instrumenting scenarios in a model-driven development environment,”Information and Software Technology, vol. 46, No. 15, pp. 1027-1036, Dec. 2004.
Gurevich, “Evolving Algebras 1993: Lipari Guide,” inSpecification and Validation Methods, E. Börger, ed., Oxford University Press, 26 pages, 1995.
Gurevich, et al., “Semantic Essence of AsmL,” Microsoft Technical Report, MSR-TR-2004-27, 55 pages, Jul. 2005.
Hartman, et al., “Model Driven Testing—AGEDIS Architecture Interfaces and Tools,” in1st European Conference on Model Driven Software Engineering, 11 pages, Dec. 2003.
Kuliamin, et al., “UniTesK: Model Based Testing in Industrial Practice,” in1st European Conference on Model Driven Software Engineering, 9 pages, Dec. 2003.
Nachmanson, et al., “Optimal Strategies for Testing Nondeterministic Systems,” inISSTA'04 Software Engineering Notes, vol. 29, 10 pages, ACM, Jul. 2004.
Puterman,Markov Decision Processes: Discrete Stochastic Dynamic Programming, Wiley-Interscience, New York, 2005.
Tretmans, et al., “TorX: Automated Model Based Testing,” in1st European Conference on Model Driven Software Engineering, 13 pages, Dec. 2003.
Yi, et al., “Testing Probabilistic and Nondeterministic Processes,”Protocol Specification, Testing and Verification, XII, pp. 47-61, North Holland, 1992.
Zhang, et al., “Optimal Transfer Trees and Distinguishing Trees for Testing Observable Nondeterministic Finite-State Machines,” IEEE Transactions on Software Engineering, vol. 29, No. 1, 14 pages, Jan. 2003.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Extending test sequences to accepting states does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Extending test sequences to accepting states, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Extending test sequences to accepting states will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4056305

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.