Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-08-08
2006-08-08
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S124000, C714S741000
Reexamination Certificate
active
07089135
ABSTRACT:
An event based test system for testing an IC device under test (DUT) designed under an automatic electronic design (EDA) environment. The event based test system includes an event memory for storing event data derived directly from simulation of design data for an intended IC in the EDA environment where the event data to denote each event is formed with time index indicating a time length from a predetermined point and an event type indicating a type of change at an event, an event generation unit for generating test vectors based on the event data where waveform of each vector is determined by the event type and a timing of the waveform is determined by accumulating the time index of previous events, and means for supplying test vectors to the DUT and evaluating response outputs of the DUT at predetermined timings.
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Le Anthony
Parnas Bruce R.
Rajsuman Rochit
Sauer Robert F.
Sugamori Shigeru
Advantest Corp.
Hoff Marc S.
Muramatsu & Associates
Robbins Janet
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