4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Anthony Le

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Apparatus and method for successively generating an event to...

Electrical computers and digital processing systems: support – Synchronization of clock or timing signals – data – or pulses – Using delay
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Apparatus for supporting and manipulating a testhead in an...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Calibration method for system performance validation of...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Error due to component compatibility
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Circuit card synchronization within a standardized test...

Electrical computers and digital processing systems: support – Synchronization of clock or timing signals – data – or pulses
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Data failure memory compaction for semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-2078314

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