Etching a substrate: processes – Masking of a substrate using material resistant to an etchant – Mask resist contains inorganic material
Reexamination Certificate
2005-08-09
2005-08-09
Ahmed, Shamim (Department: 1765)
Etching a substrate: processes
Masking of a substrate using material resistant to an etchant
Mask resist contains inorganic material
C216S041000, C216S074000, C216S079000, C438S706000, C438S723000
Reexamination Certificate
active
06926843
ABSTRACT:
Lines are fabricated by patterning a hard mask to provide a line segment, the line segment having a first dimension measured across the line segment; reacting a surface layer of the line segment to form a layer of a reaction product on a remaining portion of the line segment; and removing the reaction product without attacking the remaining portion of the line segment and without attacking the substrate to form the line segment with a dimension across the line segment that is smaller than the first dimension.
REFERENCES:
patent: 5282925 (1994-02-01), Jeng et al.
patent: 5569355 (1996-10-01), Then et al.
patent: 5585012 (1996-12-01), Wu et al.
patent: 5685951 (1997-11-01), Torek et al.
patent: 5762755 (1998-06-01), McNeilly et al.
patent: 5868811 (1999-02-01), Khan et al.
patent: 5876879 (1999-03-01), Kleinhenz et al.
patent: 5980770 (1999-11-01), Ramachandran et al.
patent: 5990019 (1999-11-01), Torek et al.
patent: 6030541 (2000-02-01), Adkisson et al.
patent: 6211044 (2001-04-01), Xiang et al.
patent: 6235627 (2001-05-01), Nakajima
Cantell Marc W.
Natzle Wesley
Ruegsegger Steven M.
Ahmed Shamim
Connolly Bove & Lodge & Hutz LLP
Sabo William D.
LandOfFree
Etching of hard masks does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Etching of hard masks, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Etching of hard masks will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3450742