Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-06-06
2006-06-06
Crane, Sara (Department: 2811)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S591000
Reexamination Certificate
active
07056780
ABSTRACT:
A metal silicide may be selectively etched by converting the metal silicide to a metal silicate. This may be done using oxidation. The metal silicate may then be removed, for example, by wet etching. A non-destructive low pH wet etchant may be utilized, in some embodiments, with high selectivity by dissolution.
REFERENCES:
patent: 4285761 (1981-08-01), Fatula et al.
patent: 6696327 (2004-02-01), Brask et al.
Brask Justin K.
Turkot, Jr. Robert B.
Crane Sara
Intel Corporation
Trop Pruner & Hu P.C.
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