Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2008-05-13
2008-05-13
Pham, Long (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S149000, C438S584000
Reexamination Certificate
active
07371622
ABSTRACT:
Gate lines including a lower Al—Nd layer and an upper MoW layer, data lines including a MoW layer, and pixel electrodes including an IZO layer are patterned using a single etchant. The etchant contains a phosphoric acid of about 50-60%, a nitric acid of about 6-10%, an acetic acid of about 15-25%, a stabilizer of about 2-5% stabilizer, and deionized water. The stabilizer includes oxy-hydride inorganic acid represented by M(OH)XLY, where M includes at least one of Zn, Sn, Cr, Al, Ba, Fe, Ti, Si and B, L includes at least one of H2O, NH3, CN and NH2R (where R is alkyl group), X is 2 or 3, and Y is 0, 1, 2 or 3.
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English Abstract for Publication No.: 010-240150.
English Abstract for Publication No.: 10-282520.
English Abstract for Publication No.: 1019990031518.
English Abstract for Publication No.: 2000-275663.
English Abstract for Publication No.: 2001-166336.
Cho Hong-Je
Kang Sung-chul
Park An-Na
Park Hong-Sick
Park Pong-Ok
F. Chau & Associates LLC.
Pham Long
Samsung Electronics Co,. Ltd.
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