Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2005-05-10
2005-05-10
Goudreau, George A. (Department: 1763)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S723000, C438S724000, C438S720000, C438S734000, C438S740000
Reexamination Certificate
active
06890863
ABSTRACT:
The present invention relates to a method of anisotropically etching a semiconductive substrate uses a hydrofluorocarbon etch gas with an etch selectivity fluorocarbon gas that previously was used to enhance oxide etching but not nitride selectivity. The present invention uses the fluorocarbon gas under conditions that enhance selectivity of the etch to nitride with respect to a bulk dielectric material such as doped and undoped silicon dioxide.
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Becker David S.
Donohoe Kevin G.
Goudreau George A.
Micro)n Technology, Inc.
Workman Nydegger
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