ESD protection circuit using zener diode and interdigitated NPN

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257362, 257363, 257175, H01L 2362

Patent

active

058500952

ABSTRACT:
The present invention provides a high efficiency ESD circuit that requires less space through uniform activation of multiple emitter fingers of a transistor structure containing an integral Zener diode. The Zener diode is able to lower the protection circuit trigger threshold from around 18 volts to around 7 volts. This method minimizes series impedance of the signal path, thereby rendering an NPN structure that is particularly well suited for protecting bipolar and CMOS input and output buffers. The ESD circuit of the present invention provides a relatively low shunt capacitance (typically <0.5 pF) and series resistance (typically <0.5 ohm) that are desirable for input and output circuits of present and future contemplated generations of sub-micron bipolar/BiCMOS circuit processes.

REFERENCES:
patent: 5223737 (1993-06-01), Canclini
patent: 5276582 (1994-01-01), Merrill et al.
patent: 5341005 (1994-08-01), Canclini
patent: 5623387 (1997-04-01), Li et al.
IEEE, 1996 ieee international reliability physics proceedings, Design and Layout of a High ESD Performance NPN Structure for Submicron BiCMOS/Bipolar Circuits, pp. 227-232.

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