Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-08
2007-05-08
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C702S069000, C702S079000, C702S065000, C703S016000, C703S019000, C324S523000, C324S532000, C324S537000
Reexamination Certificate
active
10751523
ABSTRACT:
For the purpose of readily specifying a portion of the circuit which has a high possibility of error occurring due to a variation in the supply voltage so that the specified vulnerable portion is countermeasured in a mask layout process, a simulation section simulates the operation of a semiconductor integrated circuit to obtain a transition timing of an input signal that is input to each circuit element. A simultaneous-operation circuit element number detecting section detects, based on a result of the simulation, the number of circuit elements which are supplied with the supply voltage through a common power supply line and in which transition timings of input signals occur within a predetermined time interval (e.g., 0.3 ns or shorter). A supply voltage variation level estimating section estimates the variation level of the supply voltage according to the number of circuit elements which is detected by the simultaneous-operation circuit element number detecting section.
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Kik Phallaka
Matsushita Electric - Industrial Co., Ltd.
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