Metal treatment – Barrier layer stock material – p-n type – With recess – void – dislocation – grain boundaries or channel...
Patent
1992-04-29
1994-07-26
Thomas, Tom
Metal treatment
Barrier layer stock material, p-n type
With recess, void, dislocation, grain boundaries or channel...
148 331, 148 333, 437 81, 437 82, 437126, 437131, H01L 2936
Patent
active
053324510
ABSTRACT:
An epitaxially grown compound-semiconductor crystal comprising a substrate, a buffer layer formed directly or indirectly on the substrate, and an active layer formed on the buffer layer. The buffer layer comprises (A) a high-resistivity AlGaAs or AlGaInP layer doped with oxygen or/and a transition metal and, formed thereon, (B) a layer consisting of high-purity GaAs, InGaP, or AlGaAs.
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Fukuhara Noboru
Hata Masahiko
Maeda Takayoshi
Picardat Kevin M.
Sumitomo Chemical Company Limited
Thomas Tom
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