Epitaxial growth method and substrate for epitaxial growth

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07338902

ABSTRACT:
An epitaxial growth method includes: supporting a substrate for growth (for example, an InP substrate) with a substrate supporter, growing a compound semiconductor layer comprising 3 or 4 elements (for example, a III-V group compound semiconductor such as an InGaAs layer, AlGaAs layer, AlInAs layer and AlInGaAs layer) on the substrate for growth by metal organic chemical vapor deposition, polishing the substrate so that an angle of gradient is 0.00° to 0.03° or 0.04° to 0.24° with respect to (100) direction in the entire effective area of the substrate, and forming the compound semiconductor layer to be 0.5 μm thick or more on the substrate by using the substrate for growth.

REFERENCES:
patent: 5647917 (1997-07-01), Oida et al.
patent: 2-239188 (1990-09-01), None
patent: 8-330236 (1996-12-01), None
patent: 2750331 (1998-02-01), None
Nakamura et al., Journal of Crystal Growth, vol. 129, 1993, pp. 456-464.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Epitaxial growth method and substrate for epitaxial growth does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Epitaxial growth method and substrate for epitaxial growth, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Epitaxial growth method and substrate for epitaxial growth will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2787959

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.