Epitaxial deposition of doped semiconductor materials

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – On insulating substrate or layer

Reexamination Certificate

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C438S300000, C438S758000, C257SE21102, C257SE21103

Reexamination Certificate

active

07863163

ABSTRACT:
A method for depositing a carbon doped epitaxial semiconductor layer comprises maintaining a pressure of greater than about 700 torr in a process chamber housing a patterned substrate having exposed single crystal material. The method further comprises providing a flow of a silicon source gas to the process chamber. The silicon source gas comprises dichlorosilane. The method further comprises providing a flow of a carbon precursor to the process chamber. The method further comprises selectively depositing the carbon doped epitaxial semiconductor layer on the exposed single crystal material.

REFERENCES:
patent: 4058430 (1977-11-01), Suntola et al.
patent: 4413022 (1983-11-01), Suntola et al.
patent: 4747367 (1988-05-01), Posa
patent: 4761269 (1988-08-01), Conger et al.
patent: 4910153 (1990-03-01), Dickson
patent: 5068203 (1991-11-01), Logsdon et al.
patent: 5071670 (1991-12-01), Kelly
patent: 5124278 (1992-06-01), Bohling et al.
patent: 5153295 (1992-10-01), Whitmarsh et al.
patent: 5175330 (1992-12-01), Speier
patent: 5225032 (1993-07-01), Golecki
patent: 5306666 (1994-04-01), Izumi
patent: 5426329 (1995-06-01), Tsuchimoto
patent: 5674781 (1997-10-01), Huang et al.
patent: 5711811 (1998-01-01), Suntola et al.
patent: 5769950 (1998-06-01), Takasu et al.
patent: 5831335 (1998-11-01), Miyamoto
patent: 5837580 (1998-11-01), Thakur et al.
patent: 5879459 (1999-03-01), Gadgil et al.
patent: 5897705 (1999-04-01), Siebert et al.
patent: 5904565 (1999-05-01), Nguyen et al.
patent: 5916365 (1999-06-01), Sherman
patent: 5933761 (1999-08-01), Lee
patent: 5942049 (1999-08-01), Li et al.
patent: 6037258 (2000-03-01), Liu et al.
patent: 6042654 (2000-03-01), Comita et al.
patent: 6048790 (2000-04-01), Iacoponi et al.
patent: 6069068 (2000-05-01), Rathore et al.
patent: 6077775 (2000-06-01), Stumborg et al.
patent: 6083818 (2000-07-01), Stumborg et al.
patent: 6093368 (2000-07-01), Rafferty et al.
patent: 6100184 (2000-08-01), Zhao et al.
patent: 6139700 (2000-10-01), Kang et al.
patent: 6146517 (2000-11-01), Hoinkis
patent: 6153920 (2000-11-01), Gossmann et al.
patent: 6159828 (2000-12-01), Ping et al.
patent: 6181012 (2001-01-01), Edelstein et al.
patent: 6184128 (2001-02-01), Wang et al.
patent: 6188134 (2001-02-01), Stumborg et al.
patent: 6197666 (2001-03-01), Schafer et al.
patent: 6197669 (2001-03-01), Twu et al.
patent: 6200893 (2001-03-01), Sneh
patent: 6203613 (2001-03-01), Gates et al.
patent: 6207487 (2001-03-01), Kim et al.
patent: 6207567 (2001-03-01), Wang et al.
patent: 6225213 (2001-05-01), Urabe
patent: 6270572 (2001-08-01), Kim et al.
patent: 6287965 (2001-09-01), Kang et al.
patent: 6291876 (2001-09-01), Stumborg et al.
patent: 6303523 (2001-10-01), Cheung et al.
patent: 6313017 (2001-11-01), Varhue
patent: 6340619 (2002-01-01), Ko
patent: 6342448 (2002-01-01), Lin et al.
patent: 6351039 (2002-02-01), Jin et al.
patent: 6358829 (2002-03-01), Yoon et al.
patent: 6368954 (2002-04-01), Lopatin et al.
patent: 6380065 (2002-04-01), Komai et al.
patent: 6391785 (2002-05-01), Satta et al.
patent: 6437071 (2002-08-01), Odaka et al.
patent: 6444495 (2002-09-01), Leung et al.
patent: 6455417 (2002-09-01), Bao et al.
patent: 6458718 (2002-10-01), Todd
patent: 6478873 (2002-11-01), Cheong et al.
patent: 6482733 (2002-11-01), Raaijmakers et al.
patent: 6555839 (2003-04-01), Fitzgerald
patent: 6583015 (2003-06-01), Fitzgerald et al.
patent: 6583048 (2003-06-01), Vincent et al.
patent: 6593191 (2003-07-01), Fitzgerald
patent: 6605498 (2003-08-01), Murthy et al.
patent: 6630413 (2003-10-01), Todd
patent: 6716713 (2004-04-01), Todd
patent: 6727169 (2004-04-01), Raaijmakers et al.
patent: 6821825 (2004-11-01), Todd et al.
patent: 6900115 (2005-05-01), Todd
patent: 6958253 (2005-10-01), Todd
patent: 6962859 (2005-11-01), Todd et al.
patent: 6969875 (2005-11-01), Fitzgerald
patent: 7026219 (2006-04-01), Pomarede et al.
patent: 7074623 (2006-07-01), Lochtefeld et al.
patent: 7186630 (2007-03-01), Todd
patent: 7195985 (2007-03-01), Murthy et al.
patent: 7238595 (2007-07-01), Brabant et al.
patent: 7332439 (2008-02-01), Lindert et al.
patent: 2001/0001742 (2001-05-01), Huang et al.
patent: 2001/0034123 (2001-10-01), Jeon et al.
patent: 2002/0003286 (2002-01-01), Marty et al.
patent: 2002/0023520 (2002-02-01), Hu
patent: 2002/0045359 (2002-04-01), Todd
patent: 2002/0100933 (2002-08-01), Marchant
patent: 2002/0127766 (2002-09-01), Ries et al.
patent: 2002/0151153 (2002-10-01), Drobny et al.
patent: 2002/0168868 (2002-11-01), Todd
patent: 2002/0173113 (2002-11-01), Todd
patent: 2003/0047129 (2003-03-01), Kawahara et al.
patent: 2003/0082300 (2003-05-01), Todd et al.
patent: 2003/0098465 (2003-05-01), Suzumura et al.
patent: 2003/0178700 (2003-09-01), Franosch et al.
patent: 2003/0219981 (2003-11-01), Ammon et al.
patent: 2004/0031981 (2004-02-01), Grivna
patent: 2004/0033674 (2004-02-01), Todd
patent: 2004/0045499 (2004-03-01), Langdo et al.
patent: 2004/0161617 (2004-08-01), Todd
patent: 2004/0213907 (2004-10-01), Todd et al.
patent: 2004/0224089 (2004-11-01), Singh et al.
patent: 2004/0224504 (2004-11-01), Gadgil
patent: 2004/0250298 (2004-12-01), Pinkerton et al.
patent: 2004/0262694 (2004-12-01), Chidambaram
patent: 2005/0023520 (2005-02-01), Lee et al.
patent: 2005/0042888 (2005-02-01), Roeder et al.
patent: 2005/0048745 (2005-03-01), Todd
patent: 2005/0064684 (2005-03-01), Todd et al.
patent: 2005/0079691 (2005-04-01), Kim et al.
patent: 2005/0079692 (2005-04-01), Samoilov et al.
patent: 2005/0208740 (2005-09-01), Todd
patent: 2005/0250298 (2005-11-01), Bauer
patent: 2006/0011984 (2006-01-01), Currie
patent: 2006/0014366 (2006-01-01), Currie
patent: 2006/0115933 (2006-06-01), Ye et al.
patent: 2006/0115934 (2006-06-01), Kim et al.
patent: 2006/0148151 (2006-07-01), Murthy et al.
patent: 2006/0166414 (2006-07-01), Carlson et al.
patent: 2006/0169668 (2006-08-01), Samoilov
patent: 2006/0169669 (2006-08-01), Zojaji et al.
patent: 2006/0205194 (2006-09-01), Bauer
patent: 2006/0234504 (2006-10-01), Bauer et al.
patent: 2006/0240630 (2006-10-01), Bauer et al.
patent: 2006/0289900 (2006-12-01), Thirupapuliyur et al.
patent: 2007/0161316 (2007-07-01), Taguchi et al.
patent: 2007/0287272 (2007-12-01), Bauer et al.
patent: 2008/0026149 (2008-01-01), Tomasini et al.
patent: 19820147 (1999-07-01), None
patent: 04-159284 (1992-06-01), None
patent: WO 96/17107 (1996-06-01), None
patent: WO 99/41423 (1999-08-01), None
patent: WO 99/62109 (1999-12-01), None
patent: WO 00/11721 (2000-03-01), None
patent: WO 00/13207 (2000-03-01), None
patent: WO 00/15866 (2000-03-01), None
patent: WO 00/15881 (2000-03-01), None
patent: WO 00/16377 (2000-03-01), None
patent: WO 00/22659 (2000-04-01), None
patent: WO 00/55895 (2000-09-01), None
patent: WO 00/75964 (2000-12-01), None
patent: WO 00/79576 (2000-12-01), None
patent: WO 01/15220 (2001-03-01), None
patent: WO 01/36702 (2001-05-01), None
patent: WO 01/45149 (2001-06-01), None
patent: WO 01/66832 (2001-09-01), None
patent: WO 01/78123 (2001-10-01), None
patent: WO 01/78124 (2001-10-01), None
patent: WO 01/99166 (2001-12-01), None
Zhang et al. “Selective epitaxial growth using dichlorosilane and silane by low pressure chemical napor deposition”, Microelectronic Engineering, 73-74, (2004) pp. 514-518.
de Boer, W.B and Meyer, D.J., “Low-Temperature Chemical Vapor Deposition of Epitaxial Si and SiGe Layers at Atmospheric Pressure.” Appl. Phys. Lett., vol. 58, No. 12 (Mar. 25, 1991): pp. 1286-1288.
Garone, P.M., et al. “Silicon Vapor Phase Epitaxial Growth Catalysis by the Presence of Germane.” Appl. Phys. Lett., vol. 56, No. 113 (Mar. 26, 1990): pp. 1275-1277.
Ng, Kwok K.., Complete Guide to Semiconductor Devices. 2ndEdition. IEEE Press, Wiley-Interscience, John Wiley & Sons, Inc. (2002): p. 676.
Wang, Weichung; Denton, Jack; and Neudeck, Gerold W. “Low Temperature Silicon Selective Epitaxial Growth (SEG) and Phosphorous Doping in a Reduced-Pressure Pancake Reactor.” ECE Technical Reports. Electrical and Computer Engineering, Purdue University Libraries (1992). <hhtp://docs.lib.purdue.edu/ecetr/299>.

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