Enhanced diagnosis with limited failure cycles

Details Enhanced diagnosis with limited failure cycles Enhanced diagnosis with limited failure cycles

2006-08-25

2010-11-23

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000, C714S742000

Reexamination Certificate

active

07840862

ABSTRACT:
Chain or logic diagnosis resolution can be enhanced in the presence of limited failure cycles using embodiments of the various methods, systems, and apparatus described herein. For example, pattern sets can be ordered according to a diagnosis coverage figure, which can be used to measure chain or logic diagnosability of the pattern set. Per-pin based diagnosis techniques can also be used to analyze limited failure data.

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