Enabling test modes of individual integrated circuit devices...

Details Enabling test modes of individual integrated circuit devices... Enabling test modes of individual integrated circuit devices...

2011-03-01

2011-03-01

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S724000, C365S201000, C324S765010

Reexamination Certificate

active

07900099

ABSTRACT:
Methods and apparatus are provided. A common test-mode enable signal is received at two or more integrated circuit devices of an electronic system. A test mode of only an integrated circuit device of the two or more integrated circuit devices that was last to receive a valid command is enabled in response to the common test-mode enable signal.

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