Enabling multiple testing devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S030000, C710S017000

Reexamination Certificate

active

07469370

ABSTRACT:
A method for enabling multiple testing devices within a system. The method may include determining whether a first testing device or a second testing device is coupled to the system. Provided the first testing device is coupled to the system, the method may include enabling the first testing device to operate with an interface of the system capable of coupling to a device under test. Provided the second testing device is coupled to the system, the method may include enabling the second testing device to operate with the interface of the system.

REFERENCES:
patent: 5426649 (1995-06-01), Bllecha, Jr.
patent: 5790465 (1998-08-01), Roh et al.
patent: 5799021 (1998-08-01), Gheewala
patent: 6311292 (2001-10-01), Choquette et al.
patent: 6330622 (2001-12-01), Schaefer
patent: 6425100 (2002-07-01), Bhattacharya
patent: 6584590 (2003-06-01), Bean
patent: 6751569 (2004-06-01), Merkin et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Enabling multiple testing devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Enabling multiple testing devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Enabling multiple testing devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4038646

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.