Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-06-07
2009-02-03
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S030000, C714S042000, C714S724000, C714S718000, C365S201000
Reexamination Certificate
active
07487421
ABSTRACT:
A built-in self test unit reads tag bits of a predetermined cache entry and outputs these tag bits via an external interface. The built-in self test unit enters an emulation mode upon receipt of an emulation signal via the external interface when a first configuration register has a predetermined state. The built-in self test unit then reads tag bits upon each memory mapped read of a second configuration register. The read operation advances to next sequential tag bits upon each memory mapped read of the second configuration register. The tag bits include at least one valid bit and at least one dirty bit. The tag bits also include the most significant bits of the cached address.
REFERENCES:
patent: 5640509 (1997-06-01), Balmer et al.
patent: 6966017 (2005-11-01), Evans
patent: 7017094 (2006-03-01), Correale et al.
patent: 2003/0084389 (2003-05-01), Kottapalli et al.
Damodaran Raguram
Ramamurti Ananthakrishnan
Brady W. James
Marshall, Jr. Robert D.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Trimmings John P
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