Elliptical laser probe for shadow mask

Details Elliptical laser probe for shadow mask Elliptical laser probe for shadow mask

1995-07-21

1997-06-03

Font, Frank G.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

356385, 356386, 25055919, 25055924, G01B 1102, G01B 1104, G01B 1108, G01B 1110

Patent

active

056360290

ABSTRACT:
A laser probe for measuring apertures in a sheet of material has a laser beam and a detection system. The laser beam has a major axis and a minor axis which are orthogonal to each other. The major axis is much larger than the minor axis. The dimensions of the apertures are determined from the fraction of the laser beam which passes through the sheet of material. Slot widths are measured by identifying relatively constant amounts of light passing through the sheet as the sheet moves relative to the laser beam.

REFERENCES:
patent: 3954337 (1976-05-01), Ragland, Jr.
patent: 4330775 (1982-05-01), Iwamoto et al.
patent: 4930889 (1990-06-01), Van Donselaar et al.

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