Electrostatic deflection system with impedance matching for...

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

Reexamination Certificate

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Reexamination Certificate

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11241789

ABSTRACT:
An apparatus and method for deflecting electron beams with high precision and high throughput. At least one electrode of a deflecting capacitor is connected to a signal source via a coaxial cable. A termination resistor is further connected to the coaxial cable and the electrode at the joint of the coaxial cable and the electrode. The termination resistor has a resistance matched to the impedance of the coaxial cable and the electrode has an impedance matched to half of the impedance of the coaxial. The deflecting capacitors of the present invention have a minimized loss of precision due to eddy current. The spacing of electrodes in the deflecting capacitors is reduced by a factor of approximately two compared to the state-the-art system.

REFERENCES:
patent: 4434371 (1984-02-01), Knauer
patent: 4922196 (1990-05-01), Rigg
patent: 5208560 (1993-05-01), Yasutake
patent: 2003/0089858 (2003-05-01), Hotta et al.

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