Electrostatic chucking stage and substrate processing apparatus

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With workpiece support

Reexamination Certificate

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Details

C156S345510, C156S345520, C361S234000, C279S128000, C118S724000, C118S725000, C118S728000

Reexamination Certificate

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10413137

ABSTRACT:
This application discloses the structure of an ESC stage where a chucking electrode is sandwiched by a moderation layer and a covering layer. The moderation layer and the covering layer have the thermal expansion coefficients between the dielectric plate and the chucking electrode. This application also discloses optimum total thickness of the ESC stage, optimum volume ratio of composite which the moderation layer is made of, and an optimum range of the thermal expansion coefficient of the composite. This application further discloses a substrate processing apparatus for carrying out a process onto a substrate as the substrate is maintained at a temperature higher than room temperature, comprising the electrostatic chucking stage for holding the substrate during the process.

REFERENCES:
patent: 6178919 (2001-01-01), Li et al.
patent: 6209480 (2001-04-01), Moslehi
patent: 6272002 (2001-08-01), Mogi et al.
patent: 6549393 (2003-04-01), Kanno et al.
patent: 6756132 (2004-06-01), Fujii et al.
patent: 10270540 (1998-10-01), None

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