Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent
1991-05-16
1992-10-06
Berman, Jack I.
Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
2504421, H01J 3728
Patent
active
051534347
ABSTRACT:
An electron microscope and a method for obtaining microscopic images whereby the intensity and distribution of the internal magnetic field of a specimen are acquired with precision. The electron microscope irradiates a focused electron beam at a target specimen and detects the transmitted beam past the specimen. The irradiated position on the specimen is selected by one of three ways: by moving the specimen alone, by deflecting the focused electron beam before it enters the specimen, or by combining these two ways. In this setup, the internal magnetic field of the specimen under its irradiated spot is known through detection of the deflection of the electron beam caused by the Lorentz force and through arithmetic processing of the detected deflection. An actuator that moves the specimen comprises a support with a hole through which the electron beam passes, a specimen stage with a like hole, a plurality of piezoelectric devices, and a structure that lets the electron beam pass therethrough. The actuator also comprises a mobile stage mounted on the support and attached to the specimen stage via the multiple piezoelectric devices, the mobile stage causing the devices to shift the support normal to the electron beam. Another component of the actuator is a stage control means for supplying a driving voltage to the multiple piezoelectric devices for their position control.
REFERENCES:
patent: 3745341 (1973-07-01), Sakitani
patent: 3887811 (1975-06-01), Livesay
patent: 3908124 (1975-09-01), Rose
patent: 3909611 (1975-09-01), von Rauch
patent: 4382182 (1983-05-01), Matsuzaka et al.
patent: 4506154 (1985-03-01), Scire
patent: 4618766 (1986-10-01), van der Mast et al.
patent: 4691103 (1987-09-01), Le Poole et al.
patent: 5004918 (1991-04-01), Tsuno et al.
patent: 5012092 (1991-04-01), Kobayashi et al.
patent: 5055679 (1991-10-01), Ninomiya et al.
Physical Review, B25, 1982, 6799-6804.
Ultramicroscopy 3, 1978, pp. 203-214.
Ichihashi Mikio
Ichikawa Masakazu
Suzuki Ryo
Takeshita Masatoshi
Yajima Yusuke
Berman Jack I.
Hitachi , Ltd.
Nguyen Kiet T.
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