Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-07-31
2007-07-31
Booth, Richard A. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257S318000, C257SE21179
Reexamination Certificate
active
11671971
ABSTRACT:
A manufacturing method and a device of an EEPROM cell are provided. The method includes the following steps. First, a tunnel layer and an inter-gate dielectric layer are formed over a surface of a substrate respectively, and a doped region is formed in the substrate under the inter-gate dielectric layer and used as a control gate. Thereafter, a floating gate is formed over the inter-gate dielectric layer and the tunnel layer. Thereafter, a source region and a drain region are formed in the substrate beside two sides of the floating gate under the tunnel layer. Especially, the manufacturing method of the memory cell can be integrated with the manufacturing process of high operation voltage component and low operation voltage component.
REFERENCES:
patent: 5960274 (1999-09-01), Mehta
patent: 6489202 (2002-12-01), Hsu et al.
patent: 6900097 (2005-05-01), Chen et al.
Chen Jung-Ching
Chen Spring
Chueh Chuang-Hsin
Booth Richard A.
J.C. Patents
United Microelectronics Corp.
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