Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2006-08-01
2006-08-01
Lamarre, Guy (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S030000, C714S718000, C714S764000, C365S200000, C365S225600
Reexamination Certificate
active
07085971
ABSTRACT:
An ECC based system and method within an integrated circuit memory for self-repair of a failed memory element is disclosed. The method includes processing, within the integrated circuit, data and check bits retrieved from addressed memory locations therein. The locations of memory failures are automatically recorded within the integrated circuit. Logic circuits within the integrated circuit automatically identify failure patterns based on the locations. Based on the identified failure patterns, logic circuits within the integrated circuit then permanently replace a failed memory element with an appropriate redundancy element, using devices such as electronic fuse or antifuse. In this manner, the integrated circuit automatically identifies and effects self repair of a failed memory element therein.
REFERENCES:
patent: 4918692 (1990-04-01), Hidaka et al.
patent: 4939694 (1990-07-01), Eaton et al.
patent: 5278839 (1994-01-01), Matsumoto et al.
patent: 5548555 (1996-08-01), Lee et al.
patent: 5577050 (1996-11-01), Bair et al.
patent: 5745500 (1998-04-01), Damarla et al.
patent: 5748543 (1998-05-01), Lee et al.
patent: 5764878 (1998-06-01), Kablanian et al.
patent: 5910921 (1999-06-01), Beffa et al.
patent: 5920515 (1999-07-01), Shaik et al.
patent: 5987632 (1999-11-01), Irrinki et al.
patent: 6067262 (2000-05-01), Irrinki et al.
patent: 6081910 (2000-06-01), Mifsud et al.
patent: 6119251 (2000-09-01), Cloud et al.
patent: 6304989 (2001-10-01), Kraus et al.
patent: 6320800 (2001-11-01), Saito et al.
patent: 6415403 (2002-07-01), Huang et al.
patent: 6442083 (2002-08-01), Hotaka
patent: 6505313 (2003-01-01), Phan et al.
patent: 6519735 (2003-02-01), Holman et al.
patent: 6532181 (2003-03-01), Saito et al.
patent: 6560740 (2003-05-01), Zuraski et al.
patent: 6691252 (2004-02-01), Hughes et al.
patent: 6697290 (2004-02-01), Beucler et al.
Barth, Jr. John E.
Ellis Wayne F.
Fifield John A.
Lamarre Guy
Neff Daryl K.
Schnurmann H. Daniel
Trimmings John
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