Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate
2011-01-11
2011-01-11
Auduong, Gene N (Department: 2827)
Static information storage and retrieval
Read/write circuit
Precharge
C365S210100, C365S210120
Reexamination Certificate
active
07869292
ABSTRACT:
A dynamic type semiconductor memory device includes a sense amplifier connected with a bit line pair to amplify and sense a voltage difference on the bit line pair; a precharge circuit configured to precharge the bit line pair to a power supply voltage on a lower side in response to a first control signal; a memory cell capacitance having one end which is connected with the bit line pair through a first switch circuit which is controlled in response to a signal on a word line; and a reference cell capacitance having one end which is connected with the bit line pair through a second switch circuit which is controlled in response to a signal on a reference word line. The other end of the memory cell capacitance and the other end of the reference cell capacitance are electrically separated.
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Barth et al., “A 300MHz Multi-Banked eDRAM Macro Featuring GND Sense, Bit-Line Twisting and Direct Reference Cell Write”, ISSCC 2002/ Session 9/ DRAM and Ferroelectric Memories/ 9.3, 2002 IEEE International Solid-State Circuits Conference.
Tanabe Shogo
Yano Nobumitsu
Auduong Gene N
Renesas Electronics Corporation
Young & Thompson
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