Static information storage and retrieval – Read/write circuit – Bad bit
Patent
1997-10-17
1999-09-28
Le, Vu A.
Static information storage and retrieval
Read/write circuit
Bad bit
36523006, G11C 700
Patent
active
059599049
ABSTRACT:
A dynamic column redundancy driving circuit for a synchronous semiconductor memory device is provided. The circuit includes a first node, a precharging portion, an address determining portion, a clock delay portion, and a driving portion. The precharging portion precharges the first node in the first phase of the clock. The address determining portion is connected to the first node and includes a plurality of fuses selectively disconnected according to a defect address and changes a logic level of the first node in the second phase of the clock according to whether an address matches the defect address. The clock delay portion delays the clock. The driving portion receives the output of the address determining portion and the output of the clock delay portion and produces a redundancy wordline driving signal.
REFERENCES:
patent: 5677882 (1997-10-01), Isa et al.
patent: 5703824 (1997-12-01), Isa
Le Vu A.
Samsung Electronics Co,. Ltd.
LandOfFree
Dynamic column redundancy driving circuit for synchronous semico does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dynamic column redundancy driving circuit for synchronous semico, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic column redundancy driving circuit for synchronous semico will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-711261