DVI link with parallel test data

Details DVI link with parallel test data DVI link with parallel test data

2006-01-12

2008-10-21

Tu, Christine T (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07441172

ABSTRACT:
An embodiment includes encoding parallel digital data into encoded and parallel digital data in an encoder and generating parallel test data in a pseudo-random binary sequence generator circuit. The encoded and parallel digital data is coupled through a multiplexer to be serialized in a serializer in a normal mode of operation and the parallel test data is coupled through the multiplexer to be serialized in the serializer in a test mode of operation. Encoded and serial digital data are transmitted to a transmission medium in the normal mode, and serial test data are transmitted to the transmission medium in the test mode. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The parallel test data may be parallel pseudo-random binary sequence data. The parallel digital data may include data to generate colors in a visual image.

REFERENCES:
patent: 3956601 (1976-05-01), Harris et al.
patent: 4701916 (1987-10-01), Naven et al.
patent: 5274445 (1993-12-01), Overton et al.
patent: 5457700 (1995-10-01), Merchant
patent: 5553059 (1996-09-01), Emerson et al.
patent: 5761216 (1998-06-01), Sotome et al.
patent: 6069876 (2000-05-01), Lander et al.
patent: 6108801 (2000-08-01), Malhotra et al.
patent: 6408412 (2002-06-01), Rajsuman
patent: 6950974 (2005-09-01), Wohl et al.
patent: 7024601 (2006-04-01), Quinlan et al.
patent: 7024607 (2006-04-01), Warner et al.
patent: 2003/0070126 (2003-04-01), Werner et al.
patent: 2006/0161829 (2006-07-01), Kobayashi
patent: 0196152 (1986-10-01), None
patent: WO01/73465 (2001-10-01), None
“Digital Visual Interface, Revision 1.0”,Digital Display Working Group, (1999),pp. 1-76.
“DVI Test and Measurement Guide, Revision 1.0”,DDWG Electrical Test Working Group, (2001),pp. 1.26.

Affiliated with

Also associated with

Rating

DVI link with parallel test data does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with DVI link with parallel test data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and DVI link with parallel test data will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4014641