Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-07-18
2010-10-12
Nhu, David (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S197000, C438S692000, C438S510000, C257SE21320, C257SE21051, C257SE21421, C257SE21561, C257SE21632
Reexamination Certificate
active
07811875
ABSTRACT:
Disclosed is a complementary CMOS device having a first FET with sidewall channels and a second FET with a planar channel. The first FET can be a p-FET and the second FET can be an n-FET or vice versa. The conductor used to form the gate electrodes of the different type FETs is different and is pre-selected to optimize performance. For example, a p-FET gate electrode material can have a work function near the valence band and an n-FET gate electrode material can have a work function near the conduction band. The first gate electrodes of the first FET are located adjacent to the sidewall channels and the second gate electrode of the second FET is located above the planar channel. However, the device structure is unique in that the second gate electrode extends laterally above the first FET and is electrically coupled to the first gate electrodes.
REFERENCES:
patent: 5952701 (1999-09-01), Bulucca et al.
patent: 6066533 (2000-05-01), Yu
patent: 6166417 (2000-12-01), Bai et al.
patent: 6873020 (2005-03-01), Misra et al.
patent: 6936508 (2005-08-01), Visokay et al.
patent: 7005716 (2006-02-01), Lin et al.
patent: 7022559 (2006-04-01), Barnak et al.
patent: 7449735 (2008-11-01), Anderson et al.
patent: 2003/0178689 (2003-09-01), Maszara et al.
patent: 2003/0180994 (2003-09-01), Polishchuk et al.
patent: 2004/0080001 (2004-04-01), Takeuchi
patent: 2004/0183143 (2004-09-01), Matsuo
patent: 2005/0006711 (2005-01-01), Rotondaro et al.
patent: 2005/0070062 (2005-03-01), Visokay et al.
patent: 2005/0258500 (2005-11-01), Colombo et al.
patent: 2006/0017122 (2006-01-01), Chau et al.
Anderson Brent A.
Nowak Edward J.
Gibb I.P. Law Firm LLC
International Business Machines - Corporation
Nhu David
LandOfFree
Dual work-function single gate stack does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dual work-function single gate stack, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual work-function single gate stack will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4227994