Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-05-29
2007-05-29
Geyer, Scott B. (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S584000, C257SE21577
Reexamination Certificate
active
10710478
ABSTRACT:
A structure and method of fabricating a dual damascene interconnect structure, the structure including a dual damascene wire in a dielectric layer, the dual damascene wires extending a distance into the dielectric layer less than the thickness of the dielectric layer and dual damascene via bars integral with and extending from bottom surfaces of the dual damascene wires to a bottom surface of the dielectric layer.
REFERENCES:
patent: 5635423 (1997-06-01), Huang et al.
patent: 6133144 (2000-10-01), Tsai et al.
patent: 6429119 (2002-08-01), Chao et al.
patent: 6566242 (2003-05-01), Adams et al.
patent: 6579795 (2003-06-01), Hau-Riege
patent: 6611060 (2003-08-01), Toyoda et al.
patent: 2003/0139034 (2003-07-01), Yuang
patent: 1154467 (2001-11-01), None
R. F. Schnabel et al., Slotted Vias for Dual Damascene Interconnects in 1Gb DRAMs, 1999 Symposium on VLSI Technology Digest of Technical Papers, pp. 43-44.
McDevitt Thomas L.
Stamper Anthony K.
Geyer Scott B.
Sabo William D.
Schmeiser Olsen & Watts
Ullah Elias
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