Dual damascene wiring and method

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S584000, C257SE21577

Reexamination Certificate

active

10710478

ABSTRACT:
A structure and method of fabricating a dual damascene interconnect structure, the structure including a dual damascene wire in a dielectric layer, the dual damascene wires extending a distance into the dielectric layer less than the thickness of the dielectric layer and dual damascene via bars integral with and extending from bottom surfaces of the dual damascene wires to a bottom surface of the dielectric layer.

REFERENCES:
patent: 5635423 (1997-06-01), Huang et al.
patent: 6133144 (2000-10-01), Tsai et al.
patent: 6429119 (2002-08-01), Chao et al.
patent: 6566242 (2003-05-01), Adams et al.
patent: 6579795 (2003-06-01), Hau-Riege
patent: 6611060 (2003-08-01), Toyoda et al.
patent: 2003/0139034 (2003-07-01), Yuang
patent: 1154467 (2001-11-01), None
R. F. Schnabel et al., Slotted Vias for Dual Damascene Interconnects in 1Gb DRAMs, 1999 Symposium on VLSI Technology Digest of Technical Papers, pp. 43-44.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Dual damascene wiring and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dual damascene wiring and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual damascene wiring and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3800452

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.