Dry-developed, negative working electron resist system

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging

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430323, 430330, 430270, G03C 500

Patent

active

044978910

ABSTRACT:
A process for producing a resist pattern by dry development using a resist comprising from 70 to 50% by weight of a novolac resin and from 30 to 50% by weight of a poly(ether pentene sulfone).

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patent: 4289845 (1981-09-01), Bowden et al.
patent: 4307178 (1981-12-01), Kaplan et al.
patent: 4398001 (1983-08-01), Cheng et al.
patent: 4409317 (1983-10-01), Shiraishi
patent: 4476216 (1984-10-01), Tobias

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