Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1983-10-25
1985-02-05
Kittle, John E.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
430323, 430330, 430270, G03C 500
Patent
active
044978910
ABSTRACT:
A process for producing a resist pattern by dry development using a resist comprising from 70 to 50% by weight of a novolac resin and from 30 to 50% by weight of a poly(ether pentene sulfone).
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patent: 4289845 (1981-09-01), Bowden et al.
patent: 4307178 (1981-12-01), Kaplan et al.
patent: 4398001 (1983-08-01), Cheng et al.
patent: 4409317 (1983-10-01), Shiraishi
patent: 4476216 (1984-10-01), Tobias
Kaplan Leon H.
Kaplan Richard D.
Dees Jos,e G.
International Business Machines - Corporation
Kittle John E.
Walsh Joseph G.
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