Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-11-27
2007-11-27
Purvis, Sue A. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000, C257S303000, C257SE27086, C257SE27092, C257SE27094
Reexamination Certificate
active
11222273
ABSTRACT:
Stack and trench memory cells are provided in a DRAM memory cell array. The stack and trench memory cells are arranged so as to form identical cell pairs each having a trench capacitor, a stack capacitor and a semiconductor fin, in which the active areas of two select transistors for addressing the trench and stack capacitors are formed. The semiconductor fins are arranged in succession in the longitudinal direction to form cell rows and in this arrangement are spaced apart from one another by in each case a trench capacitor. Respectively adjacent cell rows are separated from one another by trench isolator structures and are offset with respect to one another by half the length of a cell pair. The semiconductor fins are crossed by at least two active word lines, which are orthogonal with respect to the cell rows, for addressing the select transistors realized in the semiconductor fin.
REFERENCES:
patent: 5124765 (1992-06-01), Kim et al.
patent: 5942777 (1999-08-01), Chang
patent: 6184548 (2001-02-01), Chi et al.
patent: 6493253 (2002-12-01), Hofmeister
patent: 2004/0232469 (2004-11-01), Fukuzumi
Bergner Wolfgang
Harter Johann
Mueller Wolfgang
Schloesser Till
Von Schwerin Ulrike Grüning
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Liu Benjamin Tzu-Hung
Purvis Sue A.
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