Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate
2005-07-05
2005-07-05
Nguyen, Viet Q. (Department: 2818)
Static information storage and retrieval
Read/write circuit
Having particular data buffer or latch
C365S189011, C365S193000, C365S233100, C365S202000, C365S204000
Reexamination Certificate
active
06914830
ABSTRACT:
An integrated circuit memory device is designed to perform high speed data write cycles. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. A transition of the Read/Write control line during a burst access is used to terminate the burst access and initialize the device for another burst access. Write cycle times are maximized to allow for increases in burst mode operating frequencies. Local logic gates near a nay sense amplifiers are used to control write is data drivers to provide for maximum write times without crossing current during input/output line equilibration periods. By gating global write enable signals with global equilibrate signals locally at data sense amp locations, local write cycle control signals are provided which are valid for essentially the entire cycle time minus an I/O line equilibration period in burst access memory devices. For nonburst mode memory devices such as EDO and Fast Page Mode, the write function may begin immediately following the end of the equilibration cycle to provide a maximum write time without interfering with the address setup time of the next access cycle.
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Manning Troy A.
Merritt Todd A.
Micro)n Technology, Inc.
Nguyen Viet Q.
Schwegman Lundberg Woessner & Kluth P.A.
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