Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2011-03-01
2011-03-01
Louie, Wai-Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S059000, C257S072000, C257S084000, C257S351000, C257SE21531
Reexamination Certificate
active
07897965
ABSTRACT:
A display substrate includes a gate wire, a data wire which crosses the gate wire, a display part, a dummy pixel part and a test part. The display part includes a pixel element electrically connected to the gate wire and the data wire, and the pixel element includes a display element. The dummy pixel part surrounds the display part to protect the pixel element from static electricity. The test part is formed adjacent to the display part and includes a test element having a test display element formed in a substantially same manner as the display element.
REFERENCES:
patent: 5657139 (1997-08-01), Hayashi
patent: 2006/0202923 (2006-09-01), Osada
patent: 2007/0046316 (2007-03-01), Uei et al.
Chai Chong-Chul
Goh Joon-Chul
Yoon Young-Soo
Cantor & Colburn LLP
Louie Wai-Sing
Samsung Electronics Co,. Ltd.
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