Display apparatus and method of manufacturing the same

Details Display apparatus and method of manufacturing the same Display apparatus and method of manufacturing the same

2011-07-12

2011-07-12

Ngo, Ngan (Department: 2893)

Semiconductor device manufacturing: process

With measuring or testing

Electrical characteristic sensed

C438S022000, C438S028000, C438S014000, C257S088000, C257S048000, C257SE21531, C257SE21529, C257SE21530, C257SE21521

Reexamination Certificate

active

07977125

ABSTRACT:
In a display apparatus and a method of manufacturing the display apparatus, a gate line, a data line, and a plurality of layers are formed on an array substrate on which a pixel area, a pad area, and a peripheral area are defined. During the forming processes of the gate line, the data line, and the layers, the gate line and the data line are partially exposed in the peripheral area, or contact portions formed on the gate line and the data line in the peripheral area are exposed. Thus, the gate line and the data line may be tested using the contact portions as electrical terminals during the manufacturing process of the display apparatus.

REFERENCES:
patent: 5994174 (1999-11-01), Carey et al.
patent: 2004/0109102 (2004-06-01), Chang et al.
patent: 2007/0120790 (2007-05-01), Jeon
patent: 2001-053282 (2001-02-01), None
patent: 2006-013444 (2006-01-01), None
patent: 10-2007-0018456 (2007-02-01), None
patent: 10-2007-0076843 (2007-07-01), None

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