Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2007-02-13
2007-02-13
Dinh, Son T. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S233100
Reexamination Certificate
active
11187643
ABSTRACT:
A method and apparatus for controlling a voltage generator of a memory device are provided. A temperature of the memory device is measured. If the measured temperature is outside a threshold temperature range, the memory device is allowed to be placed in a clocked standby mode (CSM), whereby the voltage generator is selectively enabled with a clock signal. If the measured temperature is within a threshold temperature range, the memory device is prevented from being placed in the clocked standby mode (CSM).
REFERENCES:
patent: 6492863 (2002-12-01), Kono et al.
patent: 6677804 (2004-01-01), Pekny
Alexander George
Heilmann Ben
Herbert David
Partsch Torsten
Dinh Son T.
Infineon - Technologies AG
Patterson & Sheridan L.L.P.
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