Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-07-22
2008-12-02
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S045000, C714S716000, C714S733000, C714S724000, C714S734000, C714S750000, C714S718000
Reexamination Certificate
active
07461312
ABSTRACT:
A Multiple Input Shift Register (MISR) is used to generate signatures, based on data from a device under test, in order to validate the proper sequence and content of the data over a defined period of time. The MISR described herein includes the ability to “tag” the signatures for each time period using an incrementing value, and make that tag and the signature readable by a test controller. The MISR has the flexibility to be reset to a known initial state (or otherwise load a seed value) at the beginning of each time period or to continue accumulating signatures without being reset (or using the seed value). Accumulation of signatures over an extended period of time allows a test controller to validate that no errors occurred during a long term test without having to closely monitor the intermediate results.
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Au Stephen Z.
Junus Eiko
Tardif John A.
Merant Guerrier
Microsoft Corporation
Trimmings John P
Vierra Magen Marcus & DeNiro LLP
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