Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure
Reexamination Certificate
2011-06-28
2011-06-28
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
Having specified scribe region structure
C038S110000, C038S033000, C257SE21214
Reexamination Certificate
active
07968431
ABSTRACT:
The present disclosure provides a method of making an integrated circuit (IC) device. The method includes forming a first IC feature and a second IC feature in a semiconductor substrate, the first and second IC features being spaced from each other and separated by a scribe region; forming, in the semiconductor substrate, a doped routing feature at least partially within the scribe region and configured to connect the first and second IC features; forming a multilayer interconnect (MLI) structure and an interlayer dielectric (ILD) on the semiconductor substrate, wherein the MLI is configured to be absent within the scribe region; and etching the ILD and the semiconductor substrate within the scribe region to form a scribe-line trench.
REFERENCES:
patent: 7598154 (2009-10-01), Izumi
Chen Hung-Lin
Hsieh Ming-Chang
Lan Chin Kun
Lee Dong-Lung
Yu Hsiu-Mei
Ahmed Selim
Haynes and Boone LLP
Pert Evan
Taiwan Semiconductor Manufacturing Company , Ltd.
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