Diagnostic method for structural scan chain designs

Details Diagnostic method for structural scan chain designs Diagnostic method for structural scan chain designs

2005-11-01

2005-11-01

Tu, Christine T. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000, C714S728000

Reexamination Certificate

active

06961886

ABSTRACT:
A method for testing and diagnosing shift register latch chains coupled to logic circuits in an integrated circuit, the method including: (a) determining which of the shift register latch chains are failing by propagating a test pattern of zeros and ones through the shift register latch chains while gating which of the shift register latch chains contents are propagated into the means for generating a test signature; and (b) for each failing shift register latch chain: (b1) propagating a test pattern through the shift register latch chains while gating a selected sequential group of latches in a failing shift register latch to propagate into the means for generating a test signature; (b2) reducing the number of latches in the sequential group of latches; and (b3) repeating steps (b1) and (b2) until all failing latches of the failing shift register latch chain have been determined.

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