Diagnostic method for detection of multiple defects in a...

Details Diagnostic method for detection of multiple defects in a... Diagnostic method for detection of multiple defects in a...

2006-09-12

2006-09-12

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C716S030000

Reexamination Certificate

active

07107502

ABSTRACT:
Examiner's permission under MPEP §608.01(q) and 37 CFR §1.125(b) is requested to submit a substitute specification and abstract. The substitute specification corrects typographical errors, grammar and formatting. No new matter has been added. The substitute specification and abstract contain no new matter to the specification of record. A marked-up version is attached along with a clean version in an appendix attached hereto.

REFERENCES:
patent: 6442720 (2002-08-01), Koprowski et al.
patent: 2003/0131294 (2003-07-01), Motika et al.
“A Technique for Fault Diagnosis of Defects in Scan Chains” by Guo et al, IEEE, paper 10.2, pp. 268-277, 2001.

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